Cite
HARVARD Citation
Mao, S. et al. (2015). Quantitative comparison of sink efficiency of Cu–Nb, Cu–V and Cu–Ni interfaces for point defects. Acta materialia. pp. 328-335. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Mao, S. et al. (2015). Quantitative comparison of sink efficiency of Cu–Nb, Cu–V and Cu–Ni interfaces for point defects. Acta materialia. pp. 328-335. [Online].