Noise reduction effect and analysis through serial multiple sampling in a CMOS image sensor with floating diffusion boost-driving. (8th March 2017)

• Record Type: Journal Article
• Authors: Wakabayashi, Hayato; Yamaguchi, Keiji; Yamagata, Yuuki
• Is Part Of: Japanese journal of applied physics. Volume 56:Number 4(2017)Supplement
• Publication Date: 2017-03-08
• Subjects: Physics -- Periodicals; 621.05
• DOI: 10.7567/JJAP.56.04CF07
• Languages: English
• ISSNs: 0021-4922

Abstract

Abstract: We have developed a 1/2.3-in. 10.3 mega pixel back-illuminated CMOS image sensor utilizing serial multiple sampling. This sensor achieves an RMS random noise of 1.3e− and row temporal noise (RTN) of 0.19e−. Serial multiple sampling is realized with a column inline averaging technique without the need for additional processing circuitry. Pixel readout is accomplished utilizing a 4-shared-pixel floating diffusion (FD) boost-driving architecture. RTN caused by column parallel readout was analyzed considering the transfer function at the system level and the developed model was verified by measurement data taken at each sampling time. This model demonstrates the RTN improvement of −1.6 dB in a parallel multiple readout architecture.