Phase imaging of nanostructures. (19th September 2008)

• Record Type: Journal Article
• Authors: Allman, Brendan; Ishizuka, Kazuo; Nugent, Keith
• Is Part Of: International journal of technology transfer and commercialisation. Volume 7:Number 2/3(2008)
• Page Start: 241
• Page End: 257
• Publication Date: 2008-09-19
• Subjects: nanostructures -- nanotechnology -- transfer of intensity equation -- HREM -- phase measurement -- quantitative phase imaging -- QPI -- aberration correction -- X-ray microscopy -- coherent diffractive imaging -- CDI; Technology transfer -- Periodicals; 338.926
• Languages: English
• ISSNs: 1470-6075

Abstract

Two properties of a wave, its intensity and colour, are familiar to all of us. A third property, phase, is less familiar and carries shape information. Quantitative Phase Imaging (QPI), the method discussed in this paper, measures phase information. It utilises the fact that a phase distribution in one plane effects the intensity distribution after propagation. Many samples at the nanoscale are phase objects. For nanostructures, the phase change of the incident wave is strong, while the modulation of amplitude may be negligible. QPI generates the refractive and thickness structure of these transparent samples in a transmission imaging geometry.