Cite
HARVARD Citation
Pelliccia, D. et al. (2014). Characterisation of embedded nano-precipitates by X-ray diffraction imaging and small-angle X-ray scattering. International journal of nanotechnology. pp. 549-554. [Online].
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Pelliccia, D. et al. (2014). Characterisation of embedded nano-precipitates by X-ray diffraction imaging and small-angle X-ray scattering. International journal of nanotechnology. pp. 549-554. [Online].