Cite
HARVARD Citation
Chiu, F. et al. (2014). Negative resistance characterisation and defective trap exploration in ZnO nonvolatile memory devices. International journal of nanotechnology. pp. 145-155. [Online].
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Chiu, F. et al. (2014). Negative resistance characterisation and defective trap exploration in ZnO nonvolatile memory devices. International journal of nanotechnology. pp. 145-155. [Online].