Product failure root cause analysis during warranty analysis for integrated product design and quality improvement for early results in downturn economy. (4th November 2010)

• Record Type: Journal Article
• Authors: De, Sudripto; Das, Arindam; Sureka, Ashish
• Is Part Of: International journal of product development. Volume 12:Number 3/4(2010)
• Page Start: 235
• Page End: 253
• Publication Date: 2010-11-04
• Subjects: warranty data analysis -- RCA -- root cause analysis -- ORD -- ontology relationship diagram -- Bayesian networks -- FMEA -- failure mode and effects analysis -- CAR -- corrective action report -- probabilistic inference -- DTC -- detection-to-correction -- CAPA -- corrective anctions -- preventive actions -- product design -- quality improvement -- product warranty -- quality management -- liability exposure; New products -- Periodicals; Technological innovations -- Periodicals; Research, Industrial -- Periodicals; 658.57505
• Languages: English
• ISSNs: 1477-9056

Abstract

We present a Root Cause Analysis model for warranty failures that integrates the field failure data with the design improvement and internal quality-management data. Key features of the proposed model are: Ontology-Relationship-Diagram (ORD) to depict the Failure-Modes and Effect-Analysis (FMEA) data, conversion of ORD into a Bayesian Network (BN) in context to a Corrective Action Reports (CAR), usage of warranty claims data as the transactional data input to the BN to elicit probabilistic inference for warranty failure, application of text-processing technique for unstructured to structured data conversion. The benefits are reduction of Detection-To-Correction (DTC) cycle time and reduce liability exposure.