Simulation of near-tip crack behaviour and its correlation to fatigue crack growth with a modified strip-yield model. (4th December 2008)

• Record Type: Journal Article
• Authors: Wang, Lei; Chen, Yongkang; Tiu, William; Xu, Yigeng
• Is Part Of: International journal of modelling, identification and control. Volume 5:Number 1(2008)
• Page Start: 77
• Page End: 91
• Publication Date: 2008-12-04
• Subjects: plasticity-induced crack closure -- numerical modelling -- simulation -- near-tip crack behaviour -- fatigue crack growth -- strip-yield model -- stress distribution -- fatigue damage -- single overload loading -- constant amplitude; Engineering -- Methodology -- Periodicals; Science -- Methodology -- Periodicals; 001.42
• Languages: English
• ISSNs: 1746-6172

Abstract

A modified strip-yield model has been developed to simulate the plasticity-induced crack closure under the constant amplitude (CA) and a single overload loading conditions. The paper focuses on the simulation of the near tip crack profiles and stress distributions during the fatigue process. Detailed information on near-tip stress and displacement fields at the maximum load (Pmax), the minimum load (Pmin), and the crack opening load (Pop) of a fatigue load cycle have been presented. The correlation of the crack closure to the near-tip material fatigue damage has been investigated and used to rationalise the crack growth behaviour under the CA and a single overload loading conditions.