Design of resolution adaptive TIQ flash ADC using AMS 0.35 µm technology. (12th June 2009)

• Record Type: Journal Article
• Authors: Rajashekar, G.; Bhat, M.S.
• Is Part Of: International journal of information and communication technology. Volume 2:Number 1/2(2009)
• Page Start: 19
• Page End: 30
• Publication Date: 2009-06-12
• Subjects: digital comparators -- flash analogue-to-digital converter -- flash ADC -- threshold inverter quantisation -- TIQ -- simulation; Information technology -- Periodicals; Computer science -- Periodicals; Telecommunication -- Periodicals; 004.05
• Languages: English
• ISSNs: 1466-6642

Abstract

This paper presents a resolution adaptive flash A/D converter design and its performance. To achieve high speed, the proposed A/D converter utilises threshold inverter quantisation technique replacing conventional analogue comparators with digital comparators. The replacement results in a faster digital conversion and a reduction of the analogue nodes in the ADC. The proposed ADC is a true variable resolution ADC, operates at 3-bit, 4-bit, 5-bit and 6-bit precision depending on control inputs. The proposed ADC is designed with AMS 0.35 μm CMOS technology and 3.3 V power supply voltage and a prototype chip is fabricated. Simulation results and test results are presented.