Cite
HARVARD Citation
Mohamad, B. et al. (2018). Determination of well flat band condition in thin film FDSOI transistors using C-V measurement for accurate parameter extraction. Solid-state electronics. pp. 88-93. [Online].
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Mohamad, B. et al. (2018). Determination of well flat band condition in thin film FDSOI transistors using C-V measurement for accurate parameter extraction. Solid-state electronics. pp. 88-93. [Online].