Back Cover: Low energy scanning transmission electron beam induced current for nanoscale characterization of p–n junctions (Phys. Status Solidi RRL 1/2017). Issue 1 (24th January 2017)

• Record Type: Journal Article
• Authors: Peretzki, Patrick; Ifland, Benedikt; Jooss, Christian; Seibt, Michael
• Is Part Of: Physica status solidi. Volume 11:Issue 1(2017)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2017-01-24
• Subjects: Solid state physics -- Periodicals; 530.4105
• DOI: 10.1002/pssr.201770303
• Languages: English
• ISSNs: 1862-6254

Abstract

Abstract : No abstract is available for this article. Abstract : Electron beam induced current (EBIC) has long since been used as a standard method in scanning electron microscopy to investigate charge carrier behaviour in p–n junctions. Pushing it to high spatial resolution, the use of a transmission geometry, i.e. thin lamella samples, is mandatory.Peretzki et al. (article no. 1600358) explore the possibilities of using low electron excitation energy in a wedge shape lamella prepared by the focused ion beam technique. This geometry highlights the influence of the electron beam generation volume on the spatial resolution, which the authors simulate using an established Monte Carlo based method. A silicon p–n junction and a perovskite manganite–titanate p–n heterojunction representing systems with greatly different minority carrier diffusion lengths are investigated in this work. Results show a vanishing EBIC signal below a threshold sample thickness which clearly differs in the two systems. The manganite–titanate junction proves to be better suitable for high resolution studies. Comparing experimental and simulated data, the authors discuss the interplay of surface recombination and ion beam preparation damage in the EBIC signal as the dominant reason for the found thickness behaviour.