A monolithic MEMS position sensor for closed-loop high-speed atomic force microscopy. (22nd February 2016)

• Record Type: Journal Article
• Authors: Hosseini, N; Nievergelt, A P; Adams, J D; Stavrov, V T; Fantner, G E
• Is Part Of: Nanotechnology. Volume 27:Number 13(2016)
• Publication Date: 2016-02-22
• Subjects: atomic force microscopy -- closed loop control -- high-speed AFM -- nanopositioning -- MEMS -- position sensor; Nanotechnology -- Periodicals; Nanotechnology -- Periodicals; Nanotechnology; Publications périodiques; Nanotechnologies; Periodicals; 620.5
• DOI: 10.1088/0957-4484/27/13/135705
• Languages: English
• ISSNs: 0957-4484

Abstract

Abstract: The accuracy and repeatability of atomic force microscopy (AFM) imaging significantly depend on the accuracy of the piezoactuator. However, nonlinear properties of piezoactuators can distort the image, necessitating sensor-based closed-loop actuators to achieve high accuracy AFM imaging. The advent of high-speed AFM has made the requirements on the position sensors in such a system even more stringent, requiring higher bandwidths and lower sensor mass than traditional sensors can provide. In this paper, we demonstrate a way for high-speed, high-precision closed-loop AFM nanopositioning using a novel, miniaturized micro-electro-mechanical system position sensor in conjunction with a simple PID controller. The sensor was developed to respond to the need for small, lightweight, high-bandwidth, long-range and sub-nm-resolution position measurements in high-speed AFM applications. We demonstrate the use of this sensor for closed-loop operation of conventional as well as high-speed AFM operation to provide distortion-free images. The presented implementation of this closed-loop approach allows for positioning precision down to 2.1 Å, reduces the integral nonlinearity to below 0.2%, and allows for accurate closed loop imaging at line rates up to 300 Hz.