X-ray spectroscopy of multicharged xenon ions at the EBIT plasma. (August 2015)

• Record Type: Journal Article
• Authors: Banaś, D; Jabłoński, Ł; Jagodziński, P; Kubala-Kukuś, A; Sobota, D; Puchała, M; Pajek, M
• Is Part Of: Journal of physics. Number 635(2015)
• Publication Date: 2015-08
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/635/5/052092
• Languages: English
• ISSNs: 1742-6588

Abstract

Synopsis: X-ray spectra of multicharged xenon ions created in an electron-beam ion trap (EBIT) were measured both with a low-resolution silicon drift detector (SDD) and a high-resolution Johann/Johannson type crystal diffraction spectrometer. The measurement were performed in the electron-beam ion source (EBIS) using the transmission, leaky and pulsed modes of the ion source operation with trapped xenon ions excited by an electron beams of energies 9-15 keV. Moreover, the dynamics and equilibration of the EBIT plasma was studied by measuring the X-ray spectra for different electron energies and trapping times. The results will be discussed using available theoretical models describing the atomic processes in the EBIT plasma.