Line Profile Property of Autoionizing States. (July 2015)
- Record Type:
- Journal Article
- Title:
- Line Profile Property of Autoionizing States. (July 2015)
- Main Title:
- Line Profile Property of Autoionizing States
- Authors:
- Tu, B
Xiao, J
Yao, K
Shen, Y
Yang, Y
Lu, D
Fu, Y Q
Wei, B
Zheng, C
Huang, L Y
Hutton, R
Zou, Y - Abstract:
- Synopsis: This work studied the interference effect between dielectronic recombination and radiative recombination of highly charged tungsten ions. Our result shows a coexistence of Fano and Lorentzian line profile of autoionizing states.
- Is Part Of:
- Journal of physics. Number 635(2015)
- Journal:
- Journal of physics
- Issue:
- Number 635(2015)
- Issue Display:
- Volume 635, Issue 1 (2015)
- Year:
- 2015
- Volume:
- 635
- Issue:
- 1
- Issue Sort Value:
- 2015-0635-0001-0000
- Page Start:
- Page End:
- Publication Date:
- 2015-07
- Subjects:
- Physics -- Congresses
530.5 - Journal URLs:
- http://www.iop.org/EJ/journal/1742-6596 ↗
http://ioppublishing.org/ ↗ - DOI:
- 10.1088/1742-6596/635/5/052037 ↗
- Languages:
- English
- ISSNs:
- 1742-6588
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5036.223000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 8525.xml