Cite
HARVARD Citation
Frisk, A. et al. (2016). Resonant x-ray diffraction revealing chemical disorder in sputtered L10 FeNi on Si(0 0 1). Journal of physics. p. . [Online].
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Frisk, A. et al. (2016). Resonant x-ray diffraction revealing chemical disorder in sputtered L10 FeNi on Si(0 0 1). Journal of physics. p. . [Online].