High pressure effects on U L3 x-ray absorption in partial fluorescence yield mode and single crystal x-ray diffraction in the heavy fermion compound UCd11. (15th February 2016)

• Record Type: Journal Article
• Authors: Nasreen, Farzana; Antonio, Daniel; VanGennep, Derrick; Booth, Corwin H; Kothapalli, Karunakar; Bauer, Eric D; Sarrao, John L; Lavina, Barbara; Iota-Herbei, Valentin; Sinogeikin, Stanislav; Chow, Paul; Xiao, Yuming; Zhao, Yusheng; Cornelius, Andrew L
• Is Part Of: Journal of physics. Volume 28:Number 10(2016)
• Publication Date: 2016-02-15
• Subjects: high pressure -- x-ray absorption -- single crystal x-ray diffraction -- uranium intermetallic -- heavy fermion -- UCd11; Condensed matter -- Periodicals; Matière condensée -- Périodiques; Vaste stoffen; Vloeistoffen; Natuurkunde; Electronic journals; Computer network resources; 530.4105
• DOI: 10.1088/0953-8984/28/10/105601
• Languages: English
• ISSNs: 0953-8984

Abstract

Abstract: We report a study of high pressure x-ray absorption (XAS) performed in the partial fluorescence yield mode (PFY) at the U L3 edge (0–28.2 GPa) and single crystal x-ray diffraction (SXD) (0–20 GPa) on the UCd11 heavy fermion compound at room temperature. Under compression, the PFY-XAS results show that the white line is shifted by +4.1(3) eV at the highest applied pressure of 28.2 GPa indicating delocalization of the 5 f electrons. The increase in full width at half maxima and decrease in relative amplitude of the white line with respect to the edge jump point towards 6 d band broadening under high pressure. A bulk modulus of K 0 = 62(1) GPa and its pressure derivative, = 4.9(2) was determined from high pressure SXD results. Both the PFY-XAS and diffraction results do not show any sign of a structural phase transition in the applied pressure range.