Rapid and adjustable shifted excitation Raman difference spectroscopy using a dual‐wavelength diode laser at 785 nm. (26th July 2018)

• Record Type: Journal Article
• Authors: Maiwald, Martin; Sumpf, Bernd; Tränkle, Günther
• Is Part Of: Journal of Raman spectroscopy. Volume 49:Number 11(2018)
• Page Start: 1765
• Page End: 1775
• Publication Date: 2018-07-26
• Subjects: 785 nm -- diode laser -- SERDS -- shifted excitation Raman difference spectroscopy; Raman spectroscopy -- Periodicals; 535.846
• DOI: 10.1002/jrs.5456
• Languages: English
• ISSNs: 0377-0486

Abstract

Abstract : Rapid and adjustable shifted excitation Raman difference spectroscopy (SERDS) using a dual‐wavelength diode laser at 785 nm is presented. The excitation source provides 170 mW optical power and two laser lines with a flexible spectral distance up to 36 cm −1 . Raman and SERDS experiments with integration times down to 50 ms are performed using Irish cream as the test sample. The results demonstrate rapid and adjustable SERDS as a potential tool for real‐time Raman applications with strong background interferences.