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HARVARD Citation
Lin, H. et al. (n.d.). Determination of the London penetration depth of FeSe0.3Te0.7 thin films by scanning SQUID microscope. Superconductor science & technology. p. . [Online].
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Lin, H. et al. (n.d.). Determination of the London penetration depth of FeSe0.3Te0.7 thin films by scanning SQUID microscope. Superconductor science & technology. p. . [Online].