Cite
HARVARD Citation
Tao, Z. et al. (2018). Impact of the post-thermal annealing on OFETs using printed contacts, printed organic gate insulator and evaporated C60 active layer. Solid-state electronics. pp. 51-59. [Online].
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Tao, Z. et al. (2018). Impact of the post-thermal annealing on OFETs using printed contacts, printed organic gate insulator and evaporated C60 active layer. Solid-state electronics. pp. 51-59. [Online].