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HARVARD Citation
Ohlídal, I. et al. (2018). Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers. Surface and interface analysis. pp. 1230-1233. [Online].
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Ohlídal, I. et al. (2018). Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers. Surface and interface analysis. pp. 1230-1233. [Online].