LaFeO3 thin films as relevant models for the surface investigation of 3‐way catalysts. (17th May 2018)

• Record Type: Journal Article
• Authors: Nandi, Shreya; Blanck, Dimitri; Carlier, Thomas; Chambrier, Marie‐Hélène; Mamede, Anne‐Sophie; Trentesaux, Martine; Simon, Pardis; Nuns, Nicolas; Roussel, Pascal; Ferri, Anthony; Paul, Jean‐Francois; Berrier, Elise
• Is Part Of: Surface and interface analysis. Volume 50:Number 11(2018)
• Page Start: 1018
• Page End: 1024
• Publication Date: 2018-05-17
• Subjects: LaFeO3 -- LEIS -- perovskite -- Raman -- XPS -- ToF‐SIMS; Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.6450
• Languages: English
• ISSNs: 0142-2421

Abstract

Abstract : Lanthanum orthoferrite, a highly potential 3‐way catalyst, shaped as a polycrystalline thin film has been comprehensively analysed by combining bulk and surface characterization techniques. The possibility to accomplish unprecedented surface information has been presented, thanks to the combined use of LEIS, XPS, and ToF‐SIMS. The structural, morphological, and surface properties at nanometric scale make such thin films indistinguishable from powdered solids. Thus, the relevance of using such model materials for advanced surface investigations of LaFeO3± δ ‐based 3‐way catalysts has been demonstrated.