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HARVARD Citation
Sinha, M. et al. (2018). Soft X‐ray characterization of ion beam sputtered magnesium oxide (MgO) thin film. Surface and interface analysis. pp. 1145-1148. [Online].
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Sinha, M. et al. (2018). Soft X‐ray characterization of ion beam sputtered magnesium oxide (MgO) thin film. Surface and interface analysis. pp. 1145-1148. [Online].