Controlling microstructure and film growth of relaxor-ferroelectric thin films for high break-down strength and energy-storage performance. Issue 1 (January 2018)

• Record Type: Journal Article
• Authors: Nguyen, Minh D.; Nguyen, Chi T.Q.; Vu, Hung N.; Rijnders, Guus
• Is Part Of: Journal of the European Ceramic Society. Volume 38:Issue 1(2018)
• Page Start: 95
• Page End: 103
• Publication Date: 2018-01
• Subjects: Reloxor ferroelectrics -- Thin films -- Microstructure -- Break-down strengths -- Energy-storage performances; Ceramic materials -- Periodicals; Composite materials -- Periodicals; Matériaux céramiques -- Périodiques; Composites -- Périodiques; Ceramic materials; Composite materials; Periodicals; Electronic journals; 666.05
• DOI: 10.1016/j.jeurceramsoc.2017.08.027
• Languages: English
• ISSNs: 0955-2219

Abstract

Abstract: The relaxor ferroelectric Pb0.9 La0.1 (Zr0.52 Ti0.48 )O3 (PLZT) thin films were deposited using pulsed laser deposition, and their microstructures, break-down field strengths and energy storage performances were investigated as a function of the buffer layer and electrode. A large recoverable energy-storage density ( U reco ) of 23.2 J/cm 3 and high energy-storage efficiency ( η ) of 91.6% obtained in the epitaxial PLZT film grown on SrRuO3 /SrTiO3 /Si are much higher than those in the textured PLZT film ( U reco = 21.9 J/cm 3, η = 87.8%) on SrRuO3 /Ca2 Nb3 O10 -nanosheet/Si and the polycrystalline PLZT film ( U reco = 17.6 J/cm 3, η = 82.6%) on Pt/Ti/SiO2 /Si, under the same condition of 1500 kV/cm and 1 kHz, due to the slim polarization loop and significant antiferroelectric-like behavior. Owing to the high break-down strength (BDS) of 2500 kV/cm, a giant U reco value of 40.2 J/cm 3 was obtained for the epitaxial PLZT film, in which U reco values of 28.4 J/cm 3 (at BDS of 2000 kV/cm) and 20.2 J/cm 3 (at BDS of 1700 kV/cm), respectively, were obtained in the textured and polycrystalline PLZT films. The excellent fatigue-free properties and high thermal stability were also observed in these films.