Cite
HARVARD Citation
Du, Y. et al. (2018). A Newly Designed Infrared Reflection Absorption Spectroscopy System for In Situ Characterization from Ultrahigh Vacuum to Ambient Pressure. Applied spectroscopy. 72 (1), pp. 122-128. [Online].
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Du, Y. et al. (2018). A Newly Designed Infrared Reflection Absorption Spectroscopy System for In Situ Characterization from Ultrahigh Vacuum to Ambient Pressure. Applied spectroscopy. 72 (1), pp. 122-128. [Online].