Cite
HARVARD Citation
Ochi, M. et al. (2015). 57.2: Electrical Characterization of BCE‐TFTs with a‐IGZTO Oxide Semiconductor Compatible with Cu and Al interconnections. Digest of technical papers. 46 (1), pp. 853-856. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Ochi, M. et al. (2015). 57.2: Electrical Characterization of BCE‐TFTs with a‐IGZTO Oxide Semiconductor Compatible with Cu and Al interconnections. Digest of technical papers. 46 (1), pp. 853-856. [Online].