52.2 Non‐Destructive Analyses of Operational Degradation of OLED Devices. Issue 1 (June 2015)

• Record Type: Journal Article
• Authors: Miyamae, Takayuki; Takada, Noriyuki; Yoshioka, Toshihiro; Miyaguchi, Satoshi; Ohata, Hiroshi; Okumoto, Hajime; Yahiro, Masayuki; Tsutsui, Yuko; Adachi, Chihaya; Tsutsui, Tetsuo
• Is Part Of: Digest of technical papers. Volume 46:Issue 1(2015)
• Page Start: 782
• Page End: 785
• Publication Date: 2015-06
• Subjects: Operational degradation -- Sum-frequency generation -- Impedance spectroscopy -- Thermally stimulated current spectroscopy; Information display systems -- Congresses; 621.3815422
• DOI: 10.1002/sdtp.10226
• Languages: English
• ISSNs: 0097-966X

Abstract

Abstract : Non‐destructive analyses are conducted on the intrinsic degradation of organic light‐emitting diodes (OLEDs). After longterm operation, sum‐frequency spectroscopy reveals changes in the molecular orientation. Furthermore, change in the mobility of the OLEDs can be evaluated from impedance spectroscopy. Carrier trap behavior is also investigated via thermally stimulated current spectroscopy.