Cite
HARVARD Citation
Martínez-Castelo, J. et al. (2017). Structural and electrical characterization of multilayer Al2O3/ZnO nanolaminates grown by atomic layer deposition. Materials science in semiconductor processing. pp. 290-295. [Online].
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Martínez-Castelo, J. et al. (2017). Structural and electrical characterization of multilayer Al2O3/ZnO nanolaminates grown by atomic layer deposition. Materials science in semiconductor processing. pp. 290-295. [Online].