A performance-aware yield analysis and optimization of manycore architectures. (August 2016)
- Record Type:
- Journal Article
- Title:
- A performance-aware yield analysis and optimization of manycore architectures. (August 2016)
- Main Title:
- A performance-aware yield analysis and optimization of manycore architectures
- Authors:
- Lee, Jeong-Gun
Kwak, Sanghoon - Abstract:
- Highlights: Asymptotic performance average yield models for manycore processors are derived. Simulation and analysis for performance average yields of manycore processors. Finding optimum manycore configurations based on simulation and analysis models. Design space exploration with different semiconductor technology parameters. Graphical abstract: Abstract: In advanced nano-scale fabrication technology, maintaining both manufacturing yield and chip reliability is a challenging issue. Recent manycore processors provide inherent core redundancy and the redundancies can be exploited to resolve the yield and reliability problems. In this paper, we develop asymptotic analysis and simulation models to better understand performance and yield joint-characteristics in a manycore processor design. Our asymptotic model is built based on Amdahl's law, Eble's rule and statistical yield equations to derive the optimum number of cores with respect to " performance-averaged yield ". Our model can predict possible impacts of different manycore processor configurations and process technology parameters on the performance average yield for given degree of parallelism. Through the asymptotic analysis and optimization based on our model, we can observe an asymptotic relationship between design parameters such as "the number of cores" and "core area" of manycore architectures with regards to its performance and yield.
- Is Part Of:
- Computers & electrical engineering. Volume 54(2016)
- Journal:
- Computers & electrical engineering
- Issue:
- Volume 54(2016)
- Issue Display:
- Volume 54, Issue 2016 (2016)
- Year:
- 2016
- Volume:
- 54
- Issue:
- 2016
- Issue Sort Value:
- 2016-0054-2016-0000
- Page Start:
- 40
- Page End:
- 52
- Publication Date:
- 2016-08
- Subjects:
- Manycore -- Semiconductor -- Yield -- Performance -- Speedup -- Reliability -- Performance averaged yield
Computer engineering -- Periodicals
Electrical engineering -- Periodicals
Electrical engineering -- Data processing -- Periodicals
Ordinateurs -- Conception et construction -- Périodiques
Électrotechnique -- Périodiques
Électrotechnique -- Informatique -- Périodiques
Computer engineering
Electrical engineering
Electrical engineering -- Data processing
Periodicals
Electronic journals
621.302854 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00457906/ ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.compeleceng.2016.07.016 ↗
- Languages:
- English
- ISSNs:
- 0045-7906
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 3394.680000
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British Library HMNTS - ELD Digital store - Ingest File:
- 8079.xml