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HARVARD Citation
Zubert, M. et al. (n.d.). Methodology of determining the applicability range of the DPL model to heat transfer in modern integrated circuits comprised of FinFETs. Microelectronics and reliability. pp. 139-153. [Online].
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Zubert, M. et al. (n.d.). Methodology of determining the applicability range of the DPL model to heat transfer in modern integrated circuits comprised of FinFETs. Microelectronics and reliability. pp. 139-153. [Online].