Cite
HARVARD Citation
Yue, H. et al. (2019). Reduction of systematic errors in structured light metrology at discontinuities in surface reflectivity. Optics and lasers in engineering. pp. 68-76. [Online].
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Yue, H. et al. (2019). Reduction of systematic errors in structured light metrology at discontinuities in surface reflectivity. Optics and lasers in engineering. pp. 68-76. [Online].