Cite
HARVARD Citation
Zhou, S. et al. (2016). Monitoring chip fatigue in an IGBT module based on grey relational analysis. Microelectronics and reliability. pp. 49-52. [Online].
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Zhou, S. et al. (2016). Monitoring chip fatigue in an IGBT module based on grey relational analysis. Microelectronics and reliability. pp. 49-52. [Online].