Cite
HARVARD Citation
Ortolino, D. et al. (2016). Failure of electrical vias manufactured in thick-film technology when loaded with short high current pulses. Microelectronics and reliability. pp. 121-128. [Online].
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Ortolino, D. et al. (2016). Failure of electrical vias manufactured in thick-film technology when loaded with short high current pulses. Microelectronics and reliability. pp. 121-128. [Online].