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HARVARD Citation
Lantreibecq, A. et al. (n.d.). Subgrains, micro-twins and dislocations characterization in monolike Si using TEM and in-situ TEM. Materials today. pp. 14732-14747. [Online].
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Lantreibecq, A. et al. (n.d.). Subgrains, micro-twins and dislocations characterization in monolike Si using TEM and in-situ TEM. Materials today. pp. 14732-14747. [Online].