Contactless graphene conductance measurements: the effect of device fabrication on terahertz time-domain spectroscopy. (2016)

• Record Type: Journal Article
• Authors: Mackenzie, David M.A.; Buron, Jonas D.; Bøggild, Peter; Jepsen, Peter U.; Petersen, Dirch H.
• Is Part Of: International journal of nanotechnology. Volume 13:Number 8/9(2016)
• Page Start: 591
• Page End: 596
• Publication Date: 2016
• Subjects: CVD graphene -- terahertz time-domain spectroscopy -- laser ablation -- T-ray -- contactless graphene conductance -- electrical conductance -- metal contacts -- nanotechnology; 620.505
• Languages: English
• ISSNs: 1475-7435

Abstract

We perform contactless full-wafer maps of the electrical conductance of a 4-inch wafer of single-layer CVD graphene using terahertz time-domain spectroscopy both before and after deposition of metal contacts and fabrication of devices via laser ablation. We find that there is no significant change in the measured conductance of graphene before and after device fabrication. We also show that precise terahertz time-domain spectroscopy can be performed when the beam spot is at sufficient distance (>1.2 mm) from metal contacts.