Cite
HARVARD Citation
Zhang, R. et al. (2016). Joint probability inference algorithms of a Bayesian network and reliability analysis of electronic products. International journal of industrial and systems engineering. pp. 126-136. [Online].
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Zhang, R. et al. (2016). Joint probability inference algorithms of a Bayesian network and reliability analysis of electronic products. International journal of industrial and systems engineering. pp. 126-136. [Online].