Cite
HARVARD Citation
Wang, X. et al. (2015). Dielectric breakdown properties of hot SF6 gas contaminated by copper at temperatures of 300–3500 K. Journal of physics. p. . [Online].
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Wang, X. et al. (2015). Dielectric breakdown properties of hot SF6 gas contaminated by copper at temperatures of 300–3500 K. Journal of physics. p. . [Online].