Cite
HARVARD Citation
Dong, H. et al. (2018). Simultaneous atomic-level visualization and high precision photocurrent measurements on photoelectric devices by in situ TEM. RSC advances. 8 (2), pp. 948-953. [Online].
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Dong, H. et al. (2018). Simultaneous atomic-level visualization and high precision photocurrent measurements on photoelectric devices by in situ TEM. RSC advances. 8 (2), pp. 948-953. [Online].