Cite
HARVARD Citation
Zhao, Y. et al. (2017). A novel defect depth measurement method based on Nonlinear System Identification for pulsed thermographic inspection. Mechanical systems and signal processing. pp. 382-395. [Online].
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Zhao, Y. et al. (2017). A novel defect depth measurement method based on Nonlinear System Identification for pulsed thermographic inspection. Mechanical systems and signal processing. pp. 382-395. [Online].