Cite
HARVARD Citation
Viale, B. et al. (2016). On the need for a new ESD verification methodology to improve the reliability of ICs in advanced 28nm UTBB FD-SOI technology. Microelectronics and reliability. pp. 101-108. [Online].
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Viale, B. et al. (2016). On the need for a new ESD verification methodology to improve the reliability of ICs in advanced 28nm UTBB FD-SOI technology. Microelectronics and reliability. pp. 101-108. [Online].