Cite
HARVARD Citation
Brand, S. et al. (2016). Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy. Microelectronics and reliability. pp. 341-345. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Brand, S. et al. (2016). Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy. Microelectronics and reliability. pp. 341-345. [Online].