Cite
HARVARD Citation
Simon-Najasek, M. et al. (2016). Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions. Microelectronics and reliability. pp. 248-253. [Online].
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Simon-Najasek, M. et al. (2016). Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions. Microelectronics and reliability. pp. 248-253. [Online].