Cite
HARVARD Citation
Khaled, A. et al. (2016). Investigating stress measurement capabilities of GHz Scanning Acoustic Microscopy for 3D failure analysis. Microelectronics and reliability. pp. 336-340. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Khaled, A. et al. (2016). Investigating stress measurement capabilities of GHz Scanning Acoustic Microscopy for 3D failure analysis. Microelectronics and reliability. pp. 336-340. [Online].