Model‐free classification of X‐ray scattering signals applied to image segmentation. Issue 5 (10th September 2018)
- Record Type:
- Journal Article
- Title:
- Model‐free classification of X‐ray scattering signals applied to image segmentation. Issue 5 (10th September 2018)
- Main Title:
- Model‐free classification of X‐ray scattering signals applied to image segmentation
- Authors:
- Lutz-Bueno, V.
Arboleda, C.
Leu, L.
Blunt, M. J.
Busch, A.
Georgiadis, A.
Bertier, P.
Schmatz, J.
Varga, Z.
Villanueva-Perez, P.
Wang, Z.
Lebugle, M.
David, C.
Stampanoni, M.
Diaz, A.
Guizar-Sicairos, M.
Menzel, A. - Abstract:
- Abstract : This article describes a modeling framework to relate the molecular orientation of nanostructures to polarized resonant soft X‐ray scattering measurements using the Born approximation and a full tensor treatment. Abstract : In most cases, the analysis of small‐angle and wide‐angle X‐ray scattering (SAXS and WAXS, respectively) requires a theoretical model to describe the sample's scattering, complicating the interpretation of the scattering resulting from complex heterogeneous samples. This is the reason why, in general, the analysis of a large number of scattering patterns, such as are generated by time‐resolved and scanning methods, remains challenging. Here, a model‐free classification method to separate SAXS/WAXS signals on the basis of their inflection points is introduced and demonstrated. This article focuses on the segmentation of scanning SAXS/WAXS maps for which each pixel corresponds to an azimuthally integrated scattering curve. In such a way, the sample composition distribution can be segmented through signal classification without applying a model or previous sample knowledge. Dimensionality reduction and clustering algorithms are employed to classify SAXS/WAXS signals according to their similarity. The number of clusters, i.e. the main sample regions detected by SAXS/WAXS signal similarity, is automatically estimated. From each cluster, a main representative SAXS/WAXS signal is extracted to uncover the spatial distribution of the mixtures of phasesAbstract : This article describes a modeling framework to relate the molecular orientation of nanostructures to polarized resonant soft X‐ray scattering measurements using the Born approximation and a full tensor treatment. Abstract : In most cases, the analysis of small‐angle and wide‐angle X‐ray scattering (SAXS and WAXS, respectively) requires a theoretical model to describe the sample's scattering, complicating the interpretation of the scattering resulting from complex heterogeneous samples. This is the reason why, in general, the analysis of a large number of scattering patterns, such as are generated by time‐resolved and scanning methods, remains challenging. Here, a model‐free classification method to separate SAXS/WAXS signals on the basis of their inflection points is introduced and demonstrated. This article focuses on the segmentation of scanning SAXS/WAXS maps for which each pixel corresponds to an azimuthally integrated scattering curve. In such a way, the sample composition distribution can be segmented through signal classification without applying a model or previous sample knowledge. Dimensionality reduction and clustering algorithms are employed to classify SAXS/WAXS signals according to their similarity. The number of clusters, i.e. the main sample regions detected by SAXS/WAXS signal similarity, is automatically estimated. From each cluster, a main representative SAXS/WAXS signal is extracted to uncover the spatial distribution of the mixtures of phases that form the sample. As examples of applications, a mudrock sample and two breast tissue lesions are segmented. … (more)
- Is Part Of:
- Journal of applied crystallography. Volume 51:Issue 5(2018)
- Journal:
- Journal of applied crystallography
- Issue:
- Volume 51:Issue 5(2018)
- Issue Display:
- Volume 51, Issue 5 (2018)
- Year:
- 2018
- Volume:
- 51
- Issue:
- 5
- Issue Sort Value:
- 2018-0051-0005-0000
- Page Start:
- 1378
- Page End:
- 1386
- Publication Date:
- 2018-09-10
- Subjects:
- polarized resonant soft X‐ray scattering -- anisotropic nanostructures -- electromagnetic modeling
Crystallography -- Periodicals
548.05 - Journal URLs:
- http://firstsearch.oclc.org ↗
http://journals.iucr.org/j/journalhomepage.html ↗
http://www-us.ebsco.com/online/direct.asp?JournalID=105188 ↗
http://www.blackwell-synergy.com/loi/jcr ↗
http://www.blackwell-synergy.com/servlet/useragent?func=showIssues&code=jcr&open=2004#C2004 ↗
http://onlinelibrary.wiley.com/journal/10.1107/S16005767 ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1107/S1600576718011032 ↗
- Languages:
- English
- ISSNs:
- 0021-8898
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 4942.400000
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British Library STI - ELD Digital store - Ingest File:
- 7576.xml