Investigation of nanoscale domain switching of 0.94 Na0.5 Bi0.5TiO3-0.06 BaTiO3 thin film under different temperatures by piezoresponse force microscopy. (15th March 2016)

• Record Type: Journal Article
• Authors: Zhan, K.; Su, M.; Han, H.; Wang, X. Y.
• Is Part Of: Ferroelectrics. Volume 493(2016)
• Page Start: 25
• Page End: 29
• Publication Date: 2016-03-15
• Subjects: Nanoscale domain switching -- atomic force microscopy -- ferroelectrics -- thin film; Ferroelectricity -- Periodicals; Ferroelectric crystals -- Periodicals; 537
• DOI: 10.1080/00150193.2016.1133999
• Languages: English
• ISSNs: 0015-0193

Abstract

Abstract: The nanoscale domain switching behavior of 0.94 Na0.5 Bi0.5 TiO3 -0.06 BaTiO3 (NBT-BT6) thin film under different temperatures (25°C-225°C) is investigated by piezoresponse force microscopy (PFM) via the direct observation on their domain structure. The results show that the polycrystal structure with polydomain state is detected in NBT-BT6 thin film. With the temperature increasing, 90°domain switching is observed, however some domains near the grain boundary does not change. The domain switching is attributed to the residual stress induced by the grain deformation, and the grain boundary plays an active role in pinning a preferential polarization state.