Cite
HARVARD Citation
Ravelli, L. et al. (2015). Interstitial oxygen related defects and nanovoids in Au implanted a-SiO2 glass depth profiled by positron annihilation spectroscopy. Journal of physics. p. . [Online].
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Ravelli, L. et al. (2015). Interstitial oxygen related defects and nanovoids in Au implanted a-SiO2 glass depth profiled by positron annihilation spectroscopy. Journal of physics. p. . [Online].