Large areas elemental mapping by ion beam analysis techniques. (July 2015)

• Record Type: Journal Article
• Authors: Silva, T F; Rodrigues, C L; Curado, J F; Allegro, P; Moro, M V; Campos, P H O V; Santos, S B; Kajiya, E A M; Rizzutto, M A; Added, N; Tabacniks, M H
• Is Part Of: Journal of physics. Number 630(2015)
• Publication Date: 2015-07
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/630/1/012016
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: The external beam line of the Laboratory for Material Analysis with Ion Beams (LAMFI) is a versatile setup for multi-technique analysis. X-ray detectors for Particle Induced X-rays Emission (PIXE) measurements, a Gamma-ray detector for Particle Induced Gamma- ray Emission (PIGE), and a particle detector for scattering analysis, such as Rutherford Backscattering Spectrometry (RBS), were already installed. In this work, we present some results, using a large (60-cm range) XYZ computer controlled sample positioning system, completely developed and build in our laboratory. The XYZ stage was installed at the external beam line and its high spacial resolution (better than 5 μm over the full range) enables positioning the sample with high accuracy and high reproducibility. The combination of a sub-millimeter beam with the large range XYZ robotic stage is being used to produce elemental maps of large areas in samples like paintings, ceramics, stones, fossils, and all sort of samples. Due to its particular characteristics, this is a unique device in the sense of multi-technique analysis of large areas. With the continuous development of the external beam line at LAMFI, coupled to the robotic XYZ stage, it is becoming a robust and reliable option for regular analysis of trace elements ( Z > 5) competing with the traditional in-vacuum ion-beam-analysis with the advantage of automatic rastering.