Improving Analytical Efficiency of EDS using a Newly-designed X-ray Detecting System for Aberration Corrected 300 kV Microscope. (August 2015)

Record Type:
Journal Article
Title:
Improving Analytical Efficiency of EDS using a Newly-designed X-ray Detecting System for Aberration Corrected 300 kV Microscope. (August 2015)
Main Title:
Improving Analytical Efficiency of EDS using a Newly-designed X-ray Detecting System for Aberration Corrected 300 kV Microscope
Authors:
Sasaki, Takeo
Sawada, Hidetaka
Okunishi, Eiji
Jimbo, Yu
Iwasawa, Yorinobu
Miyatake, Koji
Yuasa, Shuichi
Kaneyama, Toshikatsu
Abstract:
Is Part Of:
Microscopy and microanalysis. Volume 21(2015:Jun.)Supplement 3
Journal:
Microscopy and microanalysis
Issue:
Volume 21(2015:Jun.)Supplement 3
Issue Display:
Volume 21, Issue 3 (2015)
Year:
2015
Volume:
21
Issue:
3
Issue Sort Value:
2015-0021-0003-0000
Page Start:
1861
Page End:
1862
Publication Date:
2015-08
Subjects:
Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82
Journal URLs:
https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗
DOI:
10.1017/S1431927615010089 ↗
Languages:
English
ISSNs:
1431-9276
Deposit Type:
Legaldeposit
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD Digital store
Ingest File:
7515.xml