Cite
HARVARD Citation
Zheng, Y. et al. (n.d.). Characterization of Various Interfaces Structure in a Titanium Alloy Using Aberration-Corrected Scanning Transmission Electron Microscope. Microscopy and microanalysis. pp. 1517-1518. [Online].
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Zheng, Y. et al. (n.d.). Characterization of Various Interfaces Structure in a Titanium Alloy Using Aberration-Corrected Scanning Transmission Electron Microscope. Microscopy and microanalysis. pp. 1517-1518. [Online].