Cite
HARVARD Citation
Gan, Z. et al. (n.d.). Characterization of Trapped Charge in Ge/LixGe Core/Shell Structure during Lithiation using Off-axis Electron Holography. Microscopy and microanalysis. pp. 1397-1398. [Online].
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Gan, Z. et al. (n.d.). Characterization of Trapped Charge in Ge/LixGe Core/Shell Structure during Lithiation using Off-axis Electron Holography. Microscopy and microanalysis. pp. 1397-1398. [Online].