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HARVARD Citation
Chen, Y. et al. (n.d.). Integrated APT/t-EBSD for Grain Boundary Analysis of Thermally Grown Oxide on a Ni-Based Superalloy. Microscopy and microanalysis. pp. 687-688. [Online].
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Chen, Y. et al. (n.d.). Integrated APT/t-EBSD for Grain Boundary Analysis of Thermally Grown Oxide on a Ni-Based Superalloy. Microscopy and microanalysis. pp. 687-688. [Online].