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HARVARD Citation
Zhang, J. et al. (n.d.). Electron Energy-Loss Spectroscopy (EELS) Study of NbOx Film for Resistive Memory Applications. Microscopy and microanalysis. pp. 285-286. [Online].
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Zhang, J. et al. (n.d.). Electron Energy-Loss Spectroscopy (EELS) Study of NbOx Film for Resistive Memory Applications. Microscopy and microanalysis. pp. 285-286. [Online].